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Image Analysis

The extraction and analysis of data from images.


Showing results: 106 - 120 of 145 items found.

  • FerruleMaster Ferrule Auto Test Instruments

    CA3003 - UC Instruments, Corp.

    FerruleMaster could feed, focus, measure and classify the ferrules automatically. It could test over 1000 PCS ferrules in one hour, no laborer required. Ferrule Master has the high performance and accuracy and high repeatablility with the superior image processing. It is intelligent and easy to operate and maintain. Clear user interface, easy to operate, stable performance and powerful analysis capability make the Ferrule Master is the best instrument in material inspection and mass production.

  • 1.4 Megapixel USB 2.0 Microscopy Camera CCD

    INFINITY2-1R - Teledyne Lumenera

    2-1R scientific camera offers a significant performance increase for quantitative and low-light applications over its predecessor. Improved thermal management techniques combined with a much higher dynamic range and 14-bit output have resulted in a versatile entry-level research camera for documentation and image analysis in Life Science, Clinical and Material Science applications. The INFINITY2-1R easily manages seconds of exposure time with a dark current rating of less than 1 e-/s.

  • Embedded Motherboard supporting MXM Graphics Module with 8th/9th Generation Intel® Core™ i7/i5/i3 in LGA1151 Socket

    AMSTX-CF Series - ADLINK Technology Inc.

    Embedded graphics enables system developers to boost the performance of a wide range of workloads, including medical imaging, image analysis, compute acceleration, and artificial intelligence (AI). Leveraging graphics processing units (GPUs), embedded graphics can be used to increase application speed and accuracy, as well as decrease latency. Many embedded system developers are using embedded graphics solutions in real-world applications, such as medical, manufacturing, and traffic management, along with other embedded segments.

  • HDR Image Analyzer

    AJA Video Systems, Inc.

    HDR Image Analyzer delivers a comprehensive array of tools for the effective analysis of the latest HDR standards – including HLG, PQ and Rec.2020 – from 4K/UltraHD/2K/HD content in a convenient real time 1RU device. Developed in partnership with Colorfront, AJA HDR Image Analyzer supports a wealth of inputs from camera LOG formats to SDR (REC 709), PQ (ST 2084) and HLG and offers color gamut support for BT.2020 alongside traditional BT.709. AJA hardware prowess ensures high reliability and performance, with 4x 3G-SDI input and output, and DisplayPort connections.Specifically designed to be used wherever needed, the 1RU form factor fits into a range of environments, providing the confidence you need for consistent and predictable HDR production and mastering.

  • Computer Vision and Visualization

    Fraunhofer Institute for Telecommunications

    The Computer Vision and Visualization Department consists of three research and development groups working on innovative technologies in the field of monocular, stereoscopic and multichannel video processing. It covers the entire processing chain from original capture to rendering, with a focus on advanced 2D and 3D analysis, post-production synthesis, computer vision, image understanding, human-machine interaction, and immersive media , The department also has expertise in processing complex systems consisting of multiple cameras, sensors, displays, projectors or screens.

  • Universal Offline AXI Systems

    AXI XT-6 Series - Nordson Corporation

    The XT-series provides the advanced inspection capability of Nordson TEST & INSPECTION's inline system in a smaller footprint manual load/island of automation system. The platforms are designed for flexibility and ease of use for a wide variety of products requiring 2D and 2.5D automated X-ray inspection. The XT-6/XT-6A platform is a highly flexible automated X-ray inspection system with minimum footprint and a parallel-kinematic Hexaglide manipulation unit for extreme-angle off-axis image acquisition with high resolution. It is suitable for high-quality X-ray analysis of electronic assemblies and material analysis of parts that require flexible part manipulation with multiple inspection angles. For batch modes and volume inspection the XT-6 can be equipped with a single-sided conveyor setup and magazine load/unload station (XT-6A).

  • Collaboration, Reporting, And Analysis Platform

    Link-Live™ - NetAlly, LLC

    Serving as a centralized site survey, test results, analysis, and tester management system, the free Link-Live™ Cloud Service transforms team workflows with the ability to quickly and easily log, document, and report test activity from all NetAlly hand-held network testers and analyzers. Once the instrument is connected to the Link-Live Cloud Service, your test results are automatically uploaded to the dashboard for project management, analysis, collaboration and reporting. You have the option of uploading additional files, screenshots, images, profiles, packet captures, location information, and comments anytime. Also, certain NetAlly instruments with AllyCare Support can receive firmware updates “over the network” from Link-Live as they become available.

  • Easycheck Fiber Endface Inspector

    CA3002 - UC Instruments, Corp.

    The integrated style design makes the size compact and operation easy. You are no longer to worry about so many cables between monitor and microscope, greatly saving the time for operation and worktable space, thus creating more productivity. Easycheck have a series different model according to different application, it has photo capture function; for transceiver checking; X、Y adjustable; image auto analysis and judgement, etc. The user can choose the desired model per the requirement.

  • Raman Imaging & High Resolution Spectrometer

    LabRAM Odyssey - HORIBA, Ltd.

    Special 50 years anniversary series: true confocal Raman microscope enabling the most detailed images and analyses to be obtained with speed and confidence. Ideally suited for both micro and macro measurements, it offers advanced confocal imaging capabilities in 2D and 3D. With guaranteed high performance and intuitive simplicity, the LabRAM Odyssey™ is the ultimate instrument for Raman spectroscopy, widely used for standard Raman analysis, PhotoLuminescence (PL), Tip Enhanced Raman Spectroscopy (TERS) and other hybrid methods.

  • Confocal Raman Microscope

    LabRAM HR Evolution - HORIBA, Ltd.

    The LabRAM HR Evolution Raman microscopes are ideally suited for both micro and macro measurements, and offer advanced confocal imaging capabilities in 2D and 3D. The true confocal Raman microscope enables the most detailed images and analyses to be obtained with speed and confidence. With guaranteed high performance and intuitive simplicity, the LabRAM HR Evolution is the ultimate instrument for Raman spectroscopy. They are widely used for standard Raman analysis, PhotoLuminescence (PL), Tip Enhanced Raman Spectroscopy (TERS) and other hybrid methods.

  • Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)

    Rocky Mountain Laboratories, Inc.

    Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.

  • Micro XRF

    W Series - Bowman

    The W Series Micro XRF uses poly-capillary optics to focus the X-ray beam to 7.5 µm FWHM, the world’s smallest beam size for coating thickness analysis using XRF technology. A 150X magnification camera is used to measure features on that scale; it is accompanied by a secondary, low-magnification camera for live-viewing samples and birds-eye macro-view imaging. Bowman’s dual-camera system lets operators see the entire part, click the image to zoom with the high-mag camera, and pinpoint the feature to be programmed and measured.

  • Pattern Region of Interest Analysis System

    PRIAS - EDAX

    PRIAS is a synergistic new imaging technique to visualize microstructure and provide exciting new views of your materials. PRIAS enables users to quickly characterize materials without requiring full EBSD pattern indexing. Through a novel use of the EBSD camera, PRIAS provides as many as 25 positional electron detectors to allow unprecedented flexibility in image collection and visualization. Applications of PRIAS include traditional EBSD materials such as metals, ceramics, semiconductors, and minerals as well as new analysis of plastics and glasses.

  • Coverage Analysis

    VerOCode - Verocel, Inc.

    VerOCode can use the same requirements-based tests that were used in functional testing to automate the capture and analysis of structural coverage testing without instrumenting the code under test. This is part of the process used at Verocel. It then records and displays the instructions executed in a program under test, and for conditional instructions, records and displays the state of the condition code at each execution of the instruction. Structural coverage is obtained at the machine code level using the integrated image, with results reported through an annotated program listing containing the source and machine code level expansion

  • MultiBeam System

    FIB - JEOL Ltd.

    An easy-to-use, out-lens type scanning electron microscope (SEM) equipped with a Schottky electron gun, as well as a new FIB column capable of large current processing (maximum ion current 90nA) installed into one chamber. JIB-4610F enables high-resolution SEM observation after high-speed cross-section milling with FIB, and high-speed analysis with a variety of analytical instruments, such as energy dispersive X-ray spectroscopy (EDS) that takes advantage of the Schottky electron gun delivering a large probe current (200nA), electron back scatter diffraction (EBSD) to perform crystallographic characterization, and cathodoluminescence (CLD). In addition, the 3D analysis function Cut & See is included in the standard configuration, allowing cross-section milling to be executed automatically at fixed intervals, while acquiring SEM images for each cross section.

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